Invention Grant
- Patent Title: Universal methylation profiling methods
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Application No.: US14973637Application Date: 2015-12-17
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Publication No.: US10337049B2Publication Date: 2019-07-02
- Inventor: Timothy H. Bestor , Jingyue Ju , Xiaoxu Li , James J. Russo
- Applicant: Timothy H. Bestor , Jingyue Ju , Xiaoxu Li , James J. Russo
- Applicant Address: US NY New York
- Assignee: THE TRUSTEES OF COLUMBIA UNIVERSITY IN THE CITY OF NEW YORK
- Current Assignee: THE TRUSTEES OF COLUMBIA UNIVERSITY IN THE CITY OF NEW YORK
- Current Assignee Address: US NY New York
- Agency: Cooper & Dunham LLP
- Agent John P. White
- Main IPC: C12Q1/68
- IPC: C12Q1/68 ; C12Q1/6806 ; C07H19/16 ; C07H19/167 ; C12Q1/6874 ; C12N9/10 ; C12P19/34 ; C12Q1/6827
Abstract:
The present invention provides a method of determining whether cytosine residues present at a predetermined positions within a single strand of a double stranded DNA of known sequence are methylated as well as compounds for carrying out this method.
Public/Granted literature
- US20160355542A1 UNIVERSAL METHYLATION PROFILING METHODS Public/Granted day:2016-12-08
Information query
