Measurement device control system for determining a topology of a surface of a bulk material
Abstract:
For determining the topology of a bulk material surface, a series of echo curves are detected in different primary radiation directions of the antenna. In the process, the primary radiation direction of the antenna is changed in such a way that all of the generated echo curves of the series of echo curves can be used for determining the topology of the bulk material surface. As a result, the measurement time can be reduced.
Information query
Patent Agency Ranking
0/0