Invention Grant
- Patent Title: Autocorrelation measurement device
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Application No.: US15754377Application Date: 2016-08-24
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Publication No.: US10337928B2Publication Date: 2019-07-02
- Inventor: Haruyasu Ito , Yasunori Igasaki , Junji Okuma
- Applicant: HAMAMATSU PHOTONICS K.K.
- Applicant Address: JP Hamamatsu-shi, Shizuoka
- Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee Address: JP Hamamatsu-shi, Shizuoka
- Agency: Drinker Biddle & Reath LLP
- Priority: JP2015-166465 20150826
- International Application: PCT/JP2016/074672 WO 20160824
- International Announcement: WO2017/033974 WO 20170302
- Main IPC: G02F1/37
- IPC: G02F1/37 ; G01J11/00

Abstract:
An autocorrelation measurement device includes a first reflection member, a second reflection member, a focusing unit, a nonlinear optical crystal, a detection unit, a filter, an aperture, a delay adjusting unit, and an analysis unit. Incident pulsed light is transmitted through the second reflection member and incident on the first reflection member. First pulsed light reflected on a first reflection surface of the first reflection member and a second reflection surface of the second reflection member and second pulsed light reflected on a second reflection surface of the first reflection member and a first reflection surface of the second reflection member are incident on the nonlinear optical crystal via the focusing unit. Second harmonic light generated in the nonlinear optical crystal is detected by the detection unit.
Public/Granted literature
- US20180245984A1 AUTOCORRELATION MEASUREMENT DEVICE Public/Granted day:2018-08-30
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