Invention Grant
- Patent Title: FT diagram creation assistance device and FT diagram creation assistance method
-
Application No.: US14352186Application Date: 2012-09-07
-
Publication No.: US10337965B2Publication Date: 2019-07-02
- Inventor: Youji Hiraoka , Tamotsu Murakami
- Applicant: Youji Hiraoka , Tamotsu Murakami
- Applicant Address: JP Fuji-Shi JP Tokyo
- Assignee: JATCO LTD,THE UNIVERSITY OF TOKYO
- Current Assignee: JATCO LTD,THE UNIVERSITY OF TOKYO
- Current Assignee Address: JP Fuji-Shi JP Tokyo
- Agency: Foley & Lardner LLP
- Priority: JP2011-229597 20111019
- International Application: PCT/JP2012/072917 WO 20120907
- International Announcement: WO2013/058028 WO 20130425
- Main IPC: G01M99/00
- IPC: G01M99/00 ; G05B23/00 ; G05B23/02 ; G06F11/07

Abstract:
An event is classified as a fault of hardware or a fault of a system or a control system. When the event is classified as the fault of the hardware, the event is expanded into lower events, physical quantities of the event and the lower events are acquired, and it is examined whether the event is expanded properly or not based on relationship between the physical quantity of the event and the physical quantities of the lower events. When the event is classified as the fault of the system or the control system, a block diagram of the system or the control system is created, and the event is expanded into the lower events based on input/output relationship in the block diagram of the system or the control system.
Public/Granted literature
- US20150168269A1 FT DIAGRAM CREATION ASSISTANCE DEVICE AND FT DIAGRAM CREATION ASSISTANCE METHOD Public/Granted day:2015-06-18
Information query