Invention Grant
- Patent Title: Method and X-ray inspection system, in particular for non-destructively inspecting objects
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Application No.: US15111740Application Date: 2015-01-16
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Publication No.: US10338269B2Publication Date: 2019-07-02
- Inventor: Pia Dreiseitel , Sebastian König , Andreas Mader , Dirk Naumann , Jörg Nittikowski
- Applicant: Smiths Heimann GmbH
- Agency: Advent, LLP
- Agent Kevin E. West
- Priority: DE102014200679 20140116
- International Application: PCT/EP2015/050773 WO 20150116
- International Announcement: WO2015/107150 WO 20150723
- Main IPC: G06K9/20
- IPC: G06K9/20 ; G06K9/46 ; G01V5/00

Abstract:
This disclosure relates to methods for non-destructively inspecting an object, wherein electromagnetic radiation is passed through the object and intensity values of unabsorbed beams are measured and evaluated. The method can include generating a three-dimensional data set in which a first material property of the object is associated with individual spatial elements of the object using computed tomography; determining an inspection space, in the three-dimensional data set; deriving values, based on the three-dimensional data set, corresponding to a spatial geometric quantity of the inspection space in a predetermined projection direction; generating a two-dimensional data set in which a second material property of the object is associated with individual surface elements of the object, using two-dimensional X-ray; determining an inspection region in the two-dimensional data set by computing a projection of the inspection space into the two-dimensional data set; and transferring the derived values into corresponding surface elements of the projection.
Public/Granted literature
- US20160334535A1 METHOD AND X-RAY INSPECTION SYSTEM, IN PARTICULAR FOR NON-DESTRUCTIVELY INSPECTING OBJECTS Public/Granted day:2016-11-17
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