Invention Grant
- Patent Title: Electronic device test system and method thereof
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Application No.: US15493856Application Date: 2017-04-21
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Publication No.: US10338978B2Publication Date: 2019-07-02
- Inventor: Pei-Ming Chang , Shih-Chieh Hsu
- Applicant: PRIMAX ELECTRONICS LTD.
- Applicant Address: TW Taipei
- Assignee: PRIMAX ELECTRONICS LTD.
- Current Assignee: PRIMAX ELECTRONICS LTD.
- Current Assignee Address: TW Taipei
- Agency: Kirton McConkie
- Agent Evan R. Witt
- Priority: TW105138915A 20161125
- Main IPC: G06F3/00
- IPC: G06F3/00 ; G06F9/54 ; G06F11/10

Abstract:
An electronic device test system and method detects a memory serial number of an electronic device. The electronic device test system includes a Macintosh system computer, configured to execute a serial number detection program to detect the memory serial number of the electronic device; and a Windows system computer, configured to execute a serial number comparison program to compare whether the memory serial number of the electronic device satisfies a coding rule. The Macintosh system computer transmits the memory serial number to the Windows system computer by means of an RS232 interface for printing.
Public/Granted literature
- US20180150340A1 ELECTRONIC DEVICE TEST SYSTEM AND METHOD THEREOF Public/Granted day:2018-05-31
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