Invention Grant
- Patent Title: Non-intrusive monitoring and control of integrated circuits
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Application No.: US16032050Application Date: 2018-07-10
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Publication No.: US10339022B2Publication Date: 2019-07-02
- Inventor: Andrea Olgiati , Matthew Pond Baker , Steven Teig
- Applicant: Altera Corporation
- Applicant Address: US CA San Jose
- Assignee: ALTERA CORPORATION
- Current Assignee: ALTERA CORPORATION
- Current Assignee Address: US CA San Jose
- Agency: Fletcher Yoder, P.C.
- Main IPC: G06F7/38
- IPC: G06F7/38 ; H03K19/173 ; G06F11/263 ; H03K19/177 ; G06F11/22 ; G06F11/34 ; G06F17/50 ; G01R31/3185 ; G01R31/28 ; G01R31/3177 ; G06F11/07 ; G06F11/30

Abstract:
A method of monitoring operations of a set of ICs. The method loads a first set of configuration data into a first IC for configuring a group of configurable circuits of the first IC to perform operations of a user design. The method receives a definition of an event based on values of a set of signals in the user design and a set of corresponding actions to take when the event occurs. The set of signals includes at least one signal received from a second IC. The method generates an incremental second set of configuration data based on the definition of the event and the set of corresponding actions. While the first IC is performing the operations of the user design, the method loads the incremental second set of configuration data into the first IC and monitors the signals received from the second IC at the first IC.
Public/Granted literature
- US20180322026A1 NON-INTRUSIVE MONITORING AND CONTROL OF INTEGRATED CIRCUITS Public/Granted day:2018-11-08
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