Invention Grant
- Patent Title: Defect record classification
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Application No.: US15448692Application Date: 2017-03-03
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Publication No.: US10339170B2Publication Date: 2019-07-02
- Inventor: Enrique M. Acevedo Arizpe , Rosa N. Gutierrez Aguilar , Mitzi Louise Deason Ponce , Graciela Reyes Granados , Crystal F. Springer
- Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Applicant Address: US NY Armonk
- Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee Address: US NY Armonk
- Agency: Roberts Mlotkowski Safran Cole & Calderon, P.C.
- Agent Christopher K. McLane; Andrew M. Calderon
- Main IPC: G06F17/27
- IPC: G06F17/27 ; G06F16/35 ; G06F16/84 ; G06F16/36 ; G06F3/0482 ; G06F17/28

Abstract:
An approach to classify different defect records by mapping plain language phrases to a taxonomy. The approach includes a method that includes receiving, by at least one computing device, a defect record associated with a defect. The method further includes receiving, by the least one computing device, a plain language phrase or word. The method further includes mapping, by the least one computing device, the plain language phrase or word to a taxonomy. The method further includes classifying, by the least one computing device, how the defect was at least one of detected and resolved using the taxonomy.
Public/Granted literature
- US20170177591A1 DEFECT RECORD CLASSIFICATION Public/Granted day:2017-06-22
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