Invention Grant
- Patent Title: Fabrication method of semiconductor package
-
Application No.: US15698136Application Date: 2017-09-07
-
Publication No.: US10340228B2Publication Date: 2019-07-02
- Inventor: Hui-Chuan Lu , Chun-Hung Lu , Po-Yi Wu
- Applicant: Siliconware Precision Industries Co., Ltd.
- Applicant Address: TW Taichung
- Assignee: Siliconware Precision Industries Co., Ltd.
- Current Assignee: Siliconware Precision Industries Co., Ltd.
- Current Assignee Address: TW Taichung
- Agency: Mintz Levin Cohn Ferris Glovsky and Popeo, P.C.
- Agent Peter F. Corless; Steven M. Jensen
- Priority: TW103139871A 20141118
- Main IPC: H01L23/498
- IPC: H01L23/498 ; H01L23/00 ; H01L23/16 ; H01L23/31 ; H01L23/14 ; H01L21/48 ; H01L23/538

Abstract:
A semiconductor package is provided, which includes: a circuit structure having a first bottom surface and a first top surface opposite to the first bottom surface; at least a semiconductor element disposed on the first top surface of the circuit structure and electrically connected to the circuit structure; an encapsulant formed on the first top surface of the circuit structure to encapsulate the semiconductor element, wherein the encapsulant has a second bottom surface facing the first top surface of the circuit structure and a second top surface opposite to the second bottom surface; and a strengthening layer formed on the second top surface of the encapsulant, or formed between the circuit structure and the encapsulant, or formed on the first bottom surface of the circuit structure, thereby effectively preventing the encapsulant from warping and the semiconductor element from cracking.
Public/Granted literature
- US20180068959A1 FABRICATION METHOD OF SEMICONDUCTOR PACKAGE Public/Granted day:2018-03-08
Information query
IPC分类: