Invention Grant
- Patent Title: Semiconductor device
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Application No.: US15918387Application Date: 2018-03-12
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Publication No.: US10340346B2Publication Date: 2019-07-02
- Inventor: Hiroaki Katou , Kenya Kobayashi
- Applicant: Kabushiki Kaisha Toshiba , Toshiba Electronic Devices & Storage Corporation
- Applicant Address: JP Tokyo JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba,Toshiba Electronic Devices & Storage Corporation
- Current Assignee: Kabushiki Kaisha Toshiba,Toshiba Electronic Devices & Storage Corporation
- Current Assignee Address: JP Tokyo JP Tokyo
- Agency: White & Case LLP
- Priority: JP2017-179484 20170919
- Main IPC: H01L29/40
- IPC: H01L29/40 ; H01L29/78 ; H01L29/06 ; H01L29/66 ; H01L29/10

Abstract:
A semiconductor device includes a drain layer, a drift layer, a base region, a source region, trenches, base contact region, gate regions, and field plate electrodes. The drain layer extends in a first and a second direction. The drift layer is on the drain layer. The base region is on the drift layer. The source region is on the base region. The trenches are in an array and each trench reaches the drift layer from the source region. The base contact region is along the second direction in a region in which the trenches do not contiguously exist along the second direction and electrically connects the source region to the base region. Each gate regions is along an inner wall of the trenches. Each field plate electrodes is in an inside of the gate regions and is longer than the gate regions in the third direction.
Public/Granted literature
- US20190088750A1 SEMICONDUCTOR DEVICE Public/Granted day:2019-03-21
Information query
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