Invention Grant
- Patent Title: End face inspection apparatus and focused image data acquisition method
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Application No.: US15797457Application Date: 2017-10-30
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Publication No.: US10341550B2Publication Date: 2019-07-02
- Inventor: Yasuhiro Miyake , Taichi Murakami , Masayuki Shinohara
- Applicant: ANRITSU CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: ANRITSU CORPORATION
- Current Assignee: ANRITSU CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Pearne & Gordon LLP
- Priority: JP2016-229888 20161128; JP2016-229889 20161128
- Main IPC: G01M11/00
- IPC: G01M11/00 ; H04N5/232 ; G06T7/00 ; G02B6/00 ; G02B6/38

Abstract:
An end face inspection apparatus which inspects an end face of an test object, and includes optical system causing an image acquisition unit to form an image of an end face of a held test object, focusing degree changing means for changing a distance between the end face of the test object and a focal position of the optical system, and a control unit processing image data acquired in the image acquisition unit. The end face inspection apparatus acquires a series of image data which is output from the image acquisition unit at a preset time interval while the distance between the end face of the test object and the focal position of the optical system is changed, determines whether or not each piece of the image data is focused, and selects focused image data as image data for end face inspection.
Public/Granted literature
- US20180152617A1 END FACE INSPECTION APPARATUS AND FOCUSED IMAGE DATA ACQUISITION METHOD Public/Granted day:2018-05-31
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