Invention Grant
- Patent Title: Optical response measuring device and optical response measuring method
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Application No.: US15517925Application Date: 2015-10-05
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Publication No.: US10345224B2Publication Date: 2019-07-09
- Inventor: Kouji Nawata , Hiroaki Minamide , Shuzhen Fan , Feng Qi , Hiromasa Ito
- Applicant: RIKEN
- Applicant Address: JP Saitama
- Assignee: RIKEN
- Current Assignee: RIKEN
- Current Assignee Address: JP Saitama
- Agency: Seed IP Law Group LLP
- Priority: JP2014-207559 20141008
- International Application: PCT/JP2015/078254 WO 20151005
- International Announcement: WO2016/056522 WO 20160414
- Main IPC: G01N21/17
- IPC: G01N21/17 ; G01N21/3581 ; G02F1/37 ; G02F1/365 ; G02F1/35

Abstract:
An optical response measuring device is provided with a light source, first and second wavelength conversion elements and a light intensity sensor array. The light source generates a pair of light beams including light beams of first and second wavelengths, and the first wavelength conversion element generates measurement light. The measurement light is irradiated on an object for measurement and a detection light having first phase and second phase is obtained in response to this irradiation. A reference light that carries the phase of the pair of the pair light beams and the detection light both pass through a second wavelength conversion element to obtain a modulated reference light have first and second intensities. The first and second local intensities are then measured by the light intensity sensor array.
Public/Granted literature
- US20170307515A1 OPTICAL RESPONSE MEASURING DEVICE AND OPTICAL RESPONSE MEASURING METHOD Public/Granted day:2017-10-26
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