Invention Grant
- Patent Title: Detection method for electroplating process
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Application No.: US15689195Application Date: 2017-08-29
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Publication No.: US10345254B2Publication Date: 2019-07-09
- Inventor: Yung-Chang Huang , Jui-Mu Cho , Chien-Hsun Pan , Chun-Chih Lin
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee Address: TW Hsinchu
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Main IPC: G01N27/26
- IPC: G01N27/26 ; C25D13/18 ; C25D13/02 ; G01N27/416 ; C25D21/14 ; C25D21/18 ; H01L21/66 ; C25B11/04 ; C25D3/38

Abstract:
Detection methods for an electroplating process are provided. A detection method includes immersing a substrate into an electrolyte solution to perform an electroplating process. The electrolyte solution includes an additive agent. The detection method also includes immersing a detection device into the electrolyte solution. The detection method further includes applying a first alternating current (AC) voltage or direct current (DC) voltage to the detection device to detect the concentration of the additive agent. In addition, the detection method includes applying a combination of a second AC voltage and a second DC voltage to the detection device to inspect the electrolyte solution. An impurity is detected in the electrolyte solution. The detection method also includes replacing the electrolyte solution containing the impurity with another electrolyte solution.
Public/Granted literature
- US20180372665A1 DETECTION METHOD FOR ELECTROPLATING PROCESS Public/Granted day:2018-12-27
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