Invention Grant
- Patent Title: Ultrasonic inspection device and method
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Application No.: US14625788Application Date: 2015-02-19
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Publication No.: US10345268B2Publication Date: 2019-07-09
- Inventor: Hiraku Kawasaki , Tatsuya Hikichi , Saburou Shibata , Hideyuki Nakamura , Takahiro Arakawa
- Applicant: IHI Inspection and Instrumentation Co., Ltd.
- Applicant Address: JP Tokyo
- Assignee: IHI Inspection and Instrumentation Co., Ltd.
- Current Assignee: IHI Inspection and Instrumentation Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Griffin and Szipl PC
- Priority: JP2012-198376 20120910
- Main IPC: G01N29/06
- IPC: G01N29/06 ; G01N29/07 ; G01N29/34

Abstract:
An ultrasonic transmitter 3 attached to an inspecting target object 1, an ultrasonic receiver 5 receiving a reflected wave of the ultrasonic wave that has propagated from the ultrasonic transmitter 3 in the inspecting target object, a data processing device 7 acquiring position specifying data for specifying a position of a defect 1a in the inspecting target object 1 on the basis of received data representing a waveform of the reflected wave received by the ultrasonic receiver 5 are provided. The ultrasonic wave generated by the ultrasonic transmitter 3 has been frequency-modulated, and has a waveform composed of components of respective frequencies that are deviated from a resonance frequency of the ultrasonic transmitter 3 and the ultrasonic receiver 5. The data processing device 7 includes a pulse compressing unit 21 performing pulse compression on the received data, and acquires the position specifying data on the basis of the pulse-compressed received data.
Public/Granted literature
- US20150160167A1 ULTRASONIC INSPECTION DEVICE AND METHOD Public/Granted day:2015-06-11
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