Invention Grant
- Patent Title: Scanning probe microscope and scanning method thereof
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Application No.: US15937306Application Date: 2018-03-27
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Publication No.: US10345335B2Publication Date: 2019-07-09
- Inventor: Masatsugu Shigeno , Kazutoshi Watanabe , Hiroyoshi Yamamoto
- Applicant: Hitachi High-Tech Science Corporation
- Applicant Address: JP Minato-ku, Tokyo
- Assignee: Hitachi High-Tech Science Corporation
- Current Assignee: Hitachi High-Tech Science Corporation
- Current Assignee Address: JP Minato-ku, Tokyo
- Agency: Banner & Witcoff, Ltd.
- Priority: JP2017-063530 20170328
- Main IPC: G01Q10/04
- IPC: G01Q10/04 ; G01Q60/34

Abstract:
A scanning probe microscope has a cantilever having a probe at a tip of the cantilever, a driving unit that performs a separating operation for separating one of the sample and the probe from the other at a speed exceeding a response speed of the cantilever from a state where the probe is in contact with the surface of the sample, a determination unit that determines that the probe is separated from the surface of the sample when vibration of the cantilever at a predetermined amplitude is detected at a resonant frequency of the cantilever during the separating operation, and a driving control unit that stops the separating operation when the determination unit determines that the probe is separated from the surface of the sample and relatively moves the probe and the sample to a position where the probe is located on a next measuring point of the sample.
Public/Granted literature
- US20180284151A1 Scanning Probe Microscope and Scanning Method Thereof Public/Granted day:2018-10-04
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