Invention Grant
- Patent Title: Capacitor life diagnosis device, capacitor life diagnosis method, and program
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Application No.: US15162966Application Date: 2016-05-24
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Publication No.: US10345360B2Publication Date: 2019-07-09
- Inventor: Hiroshi Nakao , Yu Yonezawa , Takahiko Sugawara , Yoshiyasu Nakashima
- Applicant: FUJITSU LIMITED
- Applicant Address: JP Kawasaki
- Assignee: FUJITSU LIMITED
- Current Assignee: FUJITSU LIMITED
- Current Assignee Address: JP Kawasaki
- Agency: Staas & Halsey LLP
- Priority: JP2015-114067 20150604; JP2016-077406 20160407
- Main IPC: G01R31/02
- IPC: G01R31/02 ; G01R31/01 ; H02M1/32 ; H02M1/42 ; H02M3/335 ; H02M1/00
Abstract:
A capacitor life diagnosis device includes: a first fluctuation detecting unit configured to detect a maximum value of fluctuation in output voltage of a first capacitor every fixed time; and an output unit configured to predict a residual life of the first capacitor on the basis of temporal transition of the maximum value of fluctuation in the output voltage detected by the first fluctuation detecting unit, and output a signal indicating the residual life of the first capacitor.
Public/Granted literature
- US20160356837A1 CAPACITOR LIFE DIAGNOSIS DEVICE, CAPACITOR LIFE DIAGNOSIS METHOD, AND PROGRAM Public/Granted day:2016-12-08
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