Invention Grant
- Patent Title: Circuit arrangement for high-voltage tests and high-voltage testing system
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Application No.: US15545476Application Date: 2016-01-07
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Publication No.: US10345368B2Publication Date: 2019-07-09
- Inventor: Markus Bock
- Applicant: SIEMENS AKTIENGESESCHAFT
- Applicant Address: DE Munich
- Assignee: Siemens Aktiengesellschaft
- Current Assignee: Siemens Aktiengesellschaft
- Current Assignee Address: DE Munich
- Agent Laurence Greenberg; Werner Stemer; Ralph Locher
- Priority: DE102015200902 20150121
- International Application: PCT/EP2016/050155 WO 20160107
- International Announcement: WO2016/116293 WO 20160728
- Main IPC: G01R31/02
- IPC: G01R31/02 ; G01R31/14 ; G01R31/40 ; G01R1/04 ; G01R31/327 ; H02M1/10 ; H02M7/06
Abstract:
A circuit configuration for high-voltage tests includes an AC voltage source and at least two circuit branches, each of which can be electrically connected to the AC voltage source. An electrical AC voltage can be applied to a test object by a first circuit branch, and an electrical DC voltage can be applied to the test object by a second circuit branch which rectifies an AC voltage.
Public/Granted literature
- US20180011137A1 CIRCUIT ARRANGEMENT FOR HIGH-VOLTAGE TESTS AND HIGH-VOLTAGE TESTING SYSTEM Public/Granted day:2018-01-11
Information query
