Invention Grant
- Patent Title: Method and system for deviation detection in sensor datasets
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Application No.: US15647847Application Date: 2017-07-12
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Publication No.: US10346228B2Publication Date: 2019-07-09
- Inventor: Vinay Ramanath , Asmi Rizvi Khaleeli , Gaurav Hegde
- Applicant: Vinay Ramanath , Asmi Rizvi Khaleeli , Gaurav Hegde
- Applicant Address: DE München
- Assignee: Siemens Aktiengesellschaft
- Current Assignee: Siemens Aktiengesellschaft
- Current Assignee Address: DE München
- Agency: Lempia Summerfield Katz LLC
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F17/18 ; G06N3/02 ; G05B23/02

Abstract:
A system, device, and method of deviation detection in at least one sensor dataset associated with one or more sensors in a technical system are provided. The method includes generating a best fit model of the technical system based on a target sensor dataset. The method also includes predicting a sensor dataset of the target sensor using the best fit model and non-target sensor datasets of non-target sensors, and determining a deviation tolerance by determining a difference between the predicted sensor dataset and the target sensor dataset. The method also includes detecting deviation in actual sensor dataset of the target sensor when a data-point in the actual sensor dataset exceeds the deviation tolerance and detecting deviation in the at least one sensor dataset of the one or more sensors by detecting deviation in each of the non-target sensor datasets.
Public/Granted literature
- US20190018722A1 METHOD AND SYSTEM FOR DEVIATION DETECTION IN SENSOR DATASETS Public/Granted day:2019-01-17
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