- Patent Title: Multi-data analysis based proactive defect detection and resolution
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Application No.: US15696985Application Date: 2017-09-06
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Publication No.: US10346282B2Publication Date: 2019-07-09
- Inventor: Vikrant Shyamkant Kaulgud , Amitabh Saxena , Kapil Singi , Vibhu Saujanya Sharma
- Applicant: Accenture Global Services Limited
- Applicant Address: IE Dublin
- Assignee: ACCENTURE GLOBAL SERVICES LIMITED
- Current Assignee: ACCENTURE GLOBAL SERVICES LIMITED
- Current Assignee Address: IE Dublin
- Agency: Mannava & Kang, P.C.
- Priority: IN4153/CHE/2015 20150810
- Main IPC: G06F9/44
- IPC: G06F9/44 ; G06F11/36 ; G06Q30/02 ; G06F8/30

Abstract:
Multi-data analysis based proactive defect detection and resolution may include analyzing operational data for an application to determine whether a functionality related to the application is below a predetermined threshold associated with the functionality related to the application, and based on the analysis, generating an indication to perform defect analysis related to the functionality related to the application. A sentiment analysis may be performed on consumer data related to the application to determine a sentiment of the consumer data related to the application, and a natural language processing (NLP) analysis may be performed on the consumer data related to the application to determine a function associated with a negative sentiment. Application code and process data related to the application may be analyzed to determine a defect associated with the application. Further, a code of the application may be modified to correct the defect associated with the application.
Public/Granted literature
- US20170364433A1 MULTI-DATA ANALYSIS BASED PROACTIVE DEFECT DETECTION AND RESOLUTION Public/Granted day:2017-12-21
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