Invention Grant
- Patent Title: System analysis device and system analysis method
-
Application No.: US14767667Application Date: 2014-02-24
-
Publication No.: US10346758B2Publication Date: 2019-07-09
- Inventor: Masanao Natsumeda
- Applicant: NEC Corporation
- Applicant Address: JP Tokyo
- Assignee: NEC CORPORATION
- Current Assignee: NEC CORPORATION
- Current Assignee Address: JP Tokyo
- Priority: JP2013-035785 20130226
- International Application: PCT/JP2014/000950 WO 20140224
- International Announcement: WO2014/132612 WO 20140904
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06N7/00 ; G06F11/34 ; G05B23/02 ; G06F11/07 ; H04L12/24 ; H04L12/26

Abstract:
In invariant relation analysis, a correlation model having high abnormality detection ability is generated.A system analysis device (100) includes a correlation function storage unit (1022), and a correlation function extraction unit (1023). The correlation function storage unit (1022) stores a plurality of candidates for a correlation function expressing a correlation for each pair of metrics in a system. The correlation function extraction unit (1023) extracts a correlation function from a plurality of candidates for a correlation function as a correlation function for each pair of metrics, on the basis of a detection sensitivity indicating a likelihood of correlation destruction caused at the time of abnormality of a metric associated with a correlation function.
Public/Granted literature
- US20150379417A1 SYSTEM ANALYSIS DEVICE AND SYSTEM ANALYSIS METHOD Public/Granted day:2015-12-31
Information query