A non-destructive inspection method that comprises obtaining one or more images corresponding to an X-ray, scanning electron microscope, or CT scan of an object, assigning numeric values to pixels of the images, comparing the numeric values to reference numeric values, and identifying an anomaly in the object based on the comparison. A non-destructive inspection system that comprises at least one processor, a memory in communication with the processor and storing instructions that causes the processor to obtain an image corresponding to an X-ray, scanning electron microscope, or CT scan of an object, assign numeric values to pixels of the image, compare the assigned numeric values to reference numeric values, and identify an anomaly in the object based on the comparison.