Invention Grant
- Patent Title: Machine condition monitoring system using three dimensional thermography
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Application No.: US15618101Application Date: 2017-06-08
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Publication No.: US10346968B2Publication Date: 2019-07-09
- Inventor: Kwok Keung Yau , Sze Chai Yau
- Applicant: Kwok Keung Yau , Sze Chai Yau
- Agency: Bei & Ocean
- Agent George G. Wang
- Priority: CN201610467367 20160624
- Main IPC: G01J5/00
- IPC: G01J5/00 ; G06T7/00 ; H04N13/218 ; G02B5/10 ; H04N5/232 ; H04N5/33 ; G01N25/72

Abstract:
The present disclosure discloses a machine condition monitoring system using three-dimensional thermography, which may automatically alert an operation when detecting any anomalies in three-dimensional thermal imaging of a machine. The machine condition monitoring system is for monitoring conditions of a machine and recording three-dimensional thermal imaging of the machine, comprising: a pan-tilt-zoom thermal imaging camera, at least one infrared reflective convex mirror, and a computer server.
Public/Granted literature
- US20170372468A1 MACHINE CONDITION MONITORING SYSTEM USING THREE DIMENSIONAL THERMOGRAPHY Public/Granted day:2017-12-28
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