Invention Grant
- Patent Title: Solid state storage device and reading control method thereof for read retry process with optimal read voltage set
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Application No.: US15013023Application Date: 2016-02-02
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Publication No.: US10347330B2Publication Date: 2019-07-09
- Inventor: Shih-Jia Zeng , Jen-Chien Fu
- Applicant: Lite-On Electronics (Guangzhou) Limited , LITE-ON TECHNOLOGY CORPORATION
- Applicant Address: CN Guangzhou TW Taipei
- Assignee: LITE-ON ELECTRONICS (GUANGZHOU) LIMITED,LITE-ON TECHNOLOGY CORPORATION
- Current Assignee: LITE-ON ELECTRONICS (GUANGZHOU) LIMITED,LITE-ON TECHNOLOGY CORPORATION
- Current Assignee Address: CN Guangzhou TW Taipei
- Agency: WPAT, PC
- Priority: CN201510732764 20151028
- Main IPC: G06F11/10
- IPC: G06F11/10 ; G11C16/26 ; G11C29/52 ; G11C11/56 ; G11C16/28 ; G11C16/34

Abstract:
A reading control method for a solid state storage device includes following steps. While the solid state storage device is in an idle mode, a background monitoring operation is performed on the first block and the second block. Consequently, a first optimal read voltage set corresponding to the first block and a second optimal read voltage set corresponding to the second block are acquired. In reading operation, a default read voltage set is provided to the non-volatile memory to read a data of the first block. If a data of the first block is not successfully decoded, a read retry process is performed on the first block and the first optimal read voltage set is provided to the non-volatile memory to read the data of the first block.
Public/Granted literature
- US20170125090A1 SOLID STATE STORAGE DEVICE AND READING CONTROL METHOD THEREOF Public/Granted day:2017-05-04
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