Invention Grant
- Patent Title: X-ray interferometric imaging system
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Application No.: US14943445Application Date: 2015-11-17
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Publication No.: US10349908B2Publication Date: 2019-07-16
- Inventor: Wenbing Yun , Sylvia Jia Yun Lewis , Janos Kirz , Alan Francis Lyon
- Applicant: Sigray, Inc.
- Applicant Address: US CA Concord
- Assignee: Sigray, Inc.
- Current Assignee: Sigray, Inc.
- Current Assignee Address: US CA Concord
- Agency: Knobbe, Martens, Olson & Bear, LLP
- Main IPC: A61B6/00
- IPC: A61B6/00 ; A61B6/03 ; H01J35/08 ; H01J35/12

Abstract:
An x-ray interferometric imaging system includes an x-ray source with a target having a plurality of discrete structures arranged in a periodic pattern. The system further includes a beam-splitting x-ray grating, a stage configured to hold an object to be imaged, and an x-ray detector having a two-dimensional array of x-ray detecting elements. The object is positioned between the beam-splitting x-ray grating and the x-ray detector, the x-ray detector is positioned to detect the x-rays diffracted by the beam-splitting x-ray grating and perturbed by the object to be imaged.
Public/Granted literature
- US20160066870A1 X-RAY INTERFEROMETRIC IMAGING SYSTEM Public/Granted day:2016-03-10
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