Invention Grant
- Patent Title: Surface pressure measuring device
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Application No.: US15664191Application Date: 2017-07-31
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Publication No.: US10365175B2Publication Date: 2019-07-30
- Inventor: Tsutomu Hosoi , Ryotaro Okamoto , Takahiro Fukuda , Shinichi Miura
- Applicant: TOYOTA JIDOSHA KABUSHIKI KAISHA
- Applicant Address: JP Toyota-shi, Aichi-ken
- Assignee: TOYOTA JIDOSHA KABUSHIKI KAISHA
- Current Assignee: TOYOTA JIDOSHA KABUSHIKI KAISHA
- Current Assignee Address: JP Toyota-shi, Aichi-ken
- Agency: Sughrue Mion, PLLC
- Priority: JP2016-153066 20160803
- Main IPC: G01B5/20
- IPC: G01B5/20 ; G01B5/008 ; G01M11/02 ; G01B5/252 ; G01L5/00 ; G01B11/14

Abstract:
A surface pressure measuring device includes an abutting plate, a lift, a probe, a piezo actuator and a controller. A pinhole is formed in the abutting plate at an abutting surface that abuts a target. The lift causes the target to abut the abutting surface such that the target is compressed to a predetermined thickness. The probe is inserted through the pinhole to be movable in an axial direction of the pinhole. The piezo actuator holds a state in which a tip surface is flush with the abutting surface as the probe resists a repulsive force received from the target while the lift causes the target to abut the abutting surface. The controller calculates a local surface pressure of the target from a load applied to the probe and an area of the tip surface of the probe.
Public/Granted literature
- US10288503B2 Surface pressure measuring device Public/Granted day:2019-05-14
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