Invention Grant
- Patent Title: Detection circuit
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Application No.: US15717468Application Date: 2017-09-27
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Publication No.: US10365306B2Publication Date: 2019-07-30
- Inventor: Toshimi Yamada
- Applicant: LAPIS Semiconductor Co., Ltd.
- Applicant Address: JP Yokohama
- Assignee: LAPIS Semiconductor Co., Ltd.
- Current Assignee: LAPIS Semiconductor Co., Ltd.
- Current Assignee Address: JP Yokohama
- Agency: Rabin & Berdo, P.C.
- Priority: JP2016-189035 20160928
- Main IPC: G01R19/00
- IPC: G01R19/00 ; H03K5/08 ; G01R19/165 ; H03K3/037 ; H03K5/24 ; H03K19/20

Abstract:
A detection circuit, provided in a gamma buffer circuit that includes at least one transistor that receives the application of a first voltage and generates gradation voltages on the basis of a plurality of gamma voltages, includes: a first comparison circuit that compares the largest gamma voltage with a substrate potential of the transistor and outputs a first comparison result signal, a second comparison circuit that includes an inverter which is operable under a second voltage as a source voltage, compares a threshold voltage of the inverter with the substrate potential, and outputs a second comparison result signal; and a detection result output circuit for outputting a detection result showing if the voltage decrease or power discontinuity of the first voltage is occurring on the basis of the first comparison result signal and the second comparison result signal.
Public/Granted literature
- US20180088156A1 DETECTION CIRCUIT Public/Granted day:2018-03-29
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