Invention Grant
- Patent Title: NAND flash memory with worldline voltage compensation using compensated temperature coefficients
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Application No.: US15871133Application Date: 2018-01-15
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Publication No.: US10366760B1Publication Date: 2019-07-30
- Inventor: Minyi Chen
- Applicant: GigaDevice Semiconductor (Shanghai) Inc. , GigaDevice Semiconductor (Beijing) Inc. , GigaDevice Semiconductor (Hefei) Inc.
- Applicant Address: CN Shanghai CN Beijing CN Hefei
- Assignee: GigaDevice Semiconductor (Shanghai) Inc.,GigaDevice Semiconductor (Beijing) Inc.,GigaDevice Semiconductor (Hefei) Inc.
- Current Assignee: GigaDevice Semiconductor (Shanghai) Inc.,GigaDevice Semiconductor (Beijing) Inc.,GigaDevice Semiconductor (Hefei) Inc.
- Current Assignee Address: CN Shanghai CN Beijing CN Hefei
- Agent Gokalp Bayramoglu
- Main IPC: G11C7/04
- IPC: G11C7/04 ; G11C16/08 ; G11C16/04

Abstract:
The present application provides a NAND flash memory with wordline voltage compensate, including wordlines. Each wordline corresponds to a wordline voltage with a compensated temperature coefficient. The wordlines are divided into a plurality of groups, each group corresponds to a compensated temperature coefficient. Each wordline corresponds to a wordline address, and the groups of wordlines are divided by at least a border according to wordline addresses, or divided by zones having fixed number of wordlines.
Public/Granted literature
- US20190221266A1 NAND FLASH MEMORY WITH WORDLINE VOLTAGE COMPENSATION USING COMPENSATED TEMPERATURE COEFFICIENTS Public/Granted day:2019-07-18
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