Invention Grant
- Patent Title: Pattern forming method
-
Application No.: US16008392Application Date: 2018-06-14
-
Publication No.: US10366888B2Publication Date: 2019-07-30
- Inventor: Kazuki Yamada , Masatoshi Yamato , Hidetami Yaegashi , Yoshitaka Komuro , Takehiro Seshimo , Katsumi Ohmori
- Applicant: Tokyo Electron Limited , TOKYO OHKA KOGYO CO., LTD.
- Applicant Address: JP Tokyo JP Kanagawa
- Assignee: Tokyo Electron Limited,TOKYO OHKA KOGYO CO., LTD.
- Current Assignee: Tokyo Electron Limited,TOKYO OHKA KOGYO CO., LTD.
- Current Assignee Address: JP Tokyo JP Kanagawa
- Agency: IPUSA, PLLC
- Priority: JP2017-122563 20170622
- Main IPC: H01L21/302
- IPC: H01L21/302 ; H01L21/027 ; H01L21/308 ; H01L21/311

Abstract:
A pattern forming method includes forming a first organic film by coating an etching target film with a composition including a polymer including a cross-linkable component, infiltrating an inorganic substance into the first organic film, cross-linking the polymer, forming a second organic film on the first organic film, forming a second organic film pattern by patterning the second organic film, forming a first organic film pattern having a pitch reduced to one-half of a pitch of the second organic film pattern by patterning the first organic film by a self-aligned patterning method that uses the second organic film pattern as a core pattern, forming an etching target film pattern having a pitch reduced to one-half of a pitch of the first organic film pattern by patterning the etching target film by a self-aligned patterning method that uses the first organic film pattern as a core pattern.
Public/Granted literature
- US20180374695A1 PATTERN FORMING METHOD Public/Granted day:2018-12-27
Information query
IPC分类: