Invention Grant
- Patent Title: Analog to digital conversion apparatus and analog to digital converter calibration method of the same
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Application No.: US16026315Application Date: 2018-07-03
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Publication No.: US10367517B2Publication Date: 2019-07-30
- Inventor: Ying-Cheng Wu , Shih-Hsiung Huang
- Applicant: Realtek Semiconductor Corporation
- Applicant Address: TW Hsinchu
- Assignee: REALTEK SEMICONDUCTOR CORPORATION
- Current Assignee: REALTEK SEMICONDUCTOR CORPORATION
- Current Assignee Address: TW Hsinchu
- Agency: Locke Lord LLP
- Agent Tim Tingkang Xia, Esq.
- Priority: TW106133444A 20170928
- Main IPC: H03M1/10
- IPC: H03M1/10 ; H03M1/06 ; H03M1/44

Abstract:
An analog to digital conversion apparatus that includes an analog to digital converter (ADC), a linearity calculating module and a calibration module is provided. The ADC includes a capacitor array, a comparator and a control circuit. The capacitor array receives an input signal to perform a capacitor-switching to generate a capacitor array output signal. The comparator compares the capacitor array output signal and a comparing signal to generate a digital code output result. The control circuit controls the capacitor-switching according to the digital code output result. The linearity calculating module generates a linearity related parameter according to the digital code output result. The calibration module generates a weighting parameter according to the linearity related parameter when the linearity related parameter is not within a predetermined range to adjust the digital code output result based on the weighting parameter to generate an adjusted digital code output result.
Public/Granted literature
- US20190097645A1 ANALOG TO DIGITAL CONVERSION APPARATUS AND ANALOG TO DIGITAL CONVERTER CALIBRATION METHOD OF THE SAME Public/Granted day:2019-03-28
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