Invention Grant
- Patent Title: Systems and methods for supply quality measurement
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Application No.: US15614854Application Date: 2017-06-06
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Publication No.: US10369825B2Publication Date: 2019-08-06
- Inventor: Oleksandr Osadchyy , Tetsuji Yamaguchi
- Applicant: KYOCERA Document Solutions Inc.
- Applicant Address: JP Osaka
- Assignee: KYOCERA DOCUMENT SOLUTIONS INC.
- Current Assignee: KYOCERA DOCUMENT SOLUTIONS INC.
- Current Assignee Address: JP Osaka
- Agency: McDonnell Boehnen Hulbert & Berghoff LLP
- Main IPC: B41J29/393
- IPC: B41J29/393 ; B41F33/00 ; B41F33/02

Abstract:
Example systems and related methods may provide improved defect detection and resolution for a plurality of printing devices. An example method includes receiving information indicative of at least one aspect of a printing device from among a plurality of printing devices. The plurality of printing devices is communicatively coupled to a server. Each printing device of the plurality of printing devices includes a sensor configured to provide information indicative of at least one aspect of the respective printing device. The method also includes, based on the received information, accumulating, at the server, historical data corresponding to the at least one aspect of the plurality of printing devices. The method yet further includes comparing the accumulated historical data with model reference data. The method additionally includes, based on the comparison, determining highlighted data and causing a display device to display the highlighted data.
Public/Granted literature
- US20180345703A1 Systems and Methods for Supply Quality Measurement Public/Granted day:2018-12-06
Information query
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