Invention Grant
- Patent Title: Index of refraction sensor system with dual mode temperature control
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Application No.: US15769121Application Date: 2016-10-24
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Publication No.: US10371624B2Publication Date: 2019-08-06
- Inventor: John Anthony Balchunas
- Applicant: Entegris, Inc.
- Applicant Address: US MA Billerica
- Assignee: Entegris, Inc.
- Current Assignee: Entegris, Inc.
- Current Assignee Address: US MA Billerica
- Agency: Entegris, Inc.
- International Application: PCT/US2016/058421 WO 20161024
- International Announcement: WO2017/074855 WO 20170504
- Main IPC: G01N21/55
- IPC: G01N21/55 ; G01N21/03 ; G01N21/41

Abstract:
A sensor system (100) utilizes temperature control systems (262) and methods to achieve and maintain a sample in a sample chamber (110) at a sampling temperature. Such sensor systems and methods may employ a dual mode temperature controller including a spike mode (SMC) controller (274) and a proportional-integral-derivative (PID) mode controller (272). Based on a temperature of the sample, the temperature controller of the sensor system can initially enter the spike mode or the PID mode.
Public/Granted literature
- US20180299368A1 INDEX OF REFRACTION SENSOR SYSTEM WITH DUAL MODE TEMPERATURE CONTROL Public/Granted day:2018-10-18
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