Invention Grant
- Patent Title: Optical analysis device, optical analysis method and computer program for optical analysis using single light-emitting particle detection
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Application No.: US14188375Application Date: 2014-02-24
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Publication No.: US10371631B2Publication Date: 2019-08-06
- Inventor: Tetsuya Tanabe , Mitsushiro Yamaguchi
- Applicant: OLYMPUS CORPORATION
- Applicant Address: JP Tokyo
- Assignee: OLYMPUS CORPORATION
- Current Assignee: OLYMPUS CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Westerman, Hattori, Daniels & Adrian, LLP
- Priority: JP2011-184634 20110826
- Main IPC: G01N21/64
- IPC: G01N21/64 ; G02B21/00

Abstract:
There is provided an optical analysis technique of detecting light of a light-emitting particle in a sample solution in the scanning molecule counting method using the light measurement with a confocal or multiphoton microscope, for suppressing the scattering in detected results of signals of light of light-emitting particles smaller and achieving the improvement of accuracy. The inventive technique comprises moving the position of a light detection region along a predetermined route for multiple circulation times by changing the optical path of the optical system; detecting light from the light detection region and generating time series light intensity data during the moving of the light detection region and detecting individually a signal indicating light from each light-emitting particle existing in the predetermined route using the time series light intensity data obtained in the circulating movements of the light detection region of multiple times.
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