Invention Grant
- Patent Title: Data correction method in fine particle measuring device and fine particle measuring device
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Application No.: US14404196Application Date: 2013-04-03
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Publication No.: US10371632B2Publication Date: 2019-08-06
- Inventor: Nao Nitta , Shingo Imanishi , Taichi Takeuchi
- Applicant: Sony Corporation
- Applicant Address: JP Tokyo
- Assignee: Sony Corporation
- Current Assignee: Sony Corporation
- Current Assignee Address: JP Tokyo
- Agency: K&L Gates LLP
- Priority: JP2012-129080 20120606
- International Application: PCT/JP2013/060164 WO 20130403
- International Announcement: WO2013/183345 WO 20131212
- Main IPC: G01B21/00
- IPC: G01B21/00 ; G01N15/10 ; G01N15/14 ; G01N21/05 ; G01N21/21 ; G01N21/53 ; G01N21/64

Abstract:
To provide a technique capable of highly accurately measure the intensity and the spectrum of fluorescence and scattered light by effectively correcting measurement error that occurs due to variation of flow positions of fine particles in a channel. A data correction method for a fine particle measurement device is provided, which includes an intensity detection procedure capable of detecting light generated from a fine particle by emitting light onto the fine particle flowing through a channel, and obtaining intensity information about the light, a position detection procedure capable of obtaining position information about the fine particle, and a correction procedure for correcting the intensity information on the basis of the position information.
Public/Granted literature
- US20150112627A1 DATA CORRECTION METHOD IN FINE PARTICLE MEASURING DEVICE AND FINE PARTICLE MEASURING DEVICE Public/Granted day:2015-04-23
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