Invention Grant
- Patent Title: Cold source based noise figure measurement using S-parameters and a vector signal transceiver/vector signal analyzer/spectrum analyzer
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Application No.: US15398074Application Date: 2017-01-04
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Publication No.: US10371733B2Publication Date: 2019-08-06
- Inventor: Prabhat Pal , Vinay Kumar Velkuru , Brian J. Avenell
- Applicant: NATIONAL INSTRUMENTS CORPORATION
- Applicant Address: US TX Austin
- Assignee: National Instruments Corporation
- Current Assignee: National Instruments Corporation
- Current Assignee Address: US TX Austin
- Agency: Meyertons Hood Kivlin Kowert and Goetzel PC
- Agent Jeffrey C. Hood
- Main IPC: G01R29/26
- IPC: G01R29/26 ; G01R27/28

Abstract:
The noise figure for a radio frequency device may be obtained through power measurements. A signal flow graph based upon the S-parameter information of the entire RF system may be constructed. The S-parameter information may be representative of the microwave termination, the device, the measurement instrument and any losses due to additional components such as connecting cables/attenuators/switches, etc. The signal flow graph includes proper placement and values of the source nodes corresponding to each RF sub-system enumerated above. Noise figure measurements may include a calibration step and a measurement step. During the calibration step the noise figure and the noise temperature of the measurement instrument used for the measurement may be obtained. During the measurement step, the noise figure and the noise temperature of the device may be obtained based at least on the noise figure and noise temperature of the measurement instrument obtained during the calibration step.
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