Invention Grant
- Patent Title: Multi-layer anomaly detection framework
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Application No.: US15287249Application Date: 2016-10-06
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Publication No.: US10372120B2Publication Date: 2019-08-06
- Inventor: Sundeep R Patil , Ansh Kapil , Alexander Sagel , Lutter Michael , Oliver Baptista , Martin Kleinsteuber
- Applicant: General Electric Company
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: Buckley, Maschoff & Talwalker LLC
- Main IPC: G01M99/00
- IPC: G01M99/00 ; G05B23/02

Abstract:
According to some embodiments, a system and method are provided to receive a first plurality of data from a machine associated with a first time period. A normal operation of the machine is automatically determined based on the first plurality of data. A second plurality of data may be received from the machine associated with a second time period. An anomaly in the second plurality of data is determined.
Public/Granted literature
- US20180100784A1 MULTI-LAYER ANOMALY DETECTION FRAMEWORK Public/Granted day:2018-04-12
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