Invention Grant
- Patent Title: Storage device, test system for testing the same, and method thereof
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Application No.: US15481441Application Date: 2017-04-06
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Publication No.: US10372570B2Publication Date: 2019-08-06
- Inventor: KyuYeul Wang
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR
- Agency: Renaissance IP Law Group LLP
- Priority: KR10-2016-0099603 20160804
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/22 ; G11C29/56 ; G06F11/263

Abstract:
Embodiments include a method of a test system that comprises a host device and at least one storage device having multiple ports connected to the host device through a multi-port connection, the method comprising: issuing, by a test program at the host device, a first command; generating, by a device driver at the host device, a plurality of second commands in response to the first command; and simultaneously transferring, by the host device, the second commands to each of the at least one storage device.
Public/Granted literature
- US20180039554A1 STORAGE DEVICE, TEST SYSTEM FOR TESTING THE SAME, AND METHOD THEREOF Public/Granted day:2018-02-08
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