Invention Grant
- Patent Title: Software inspection apparatus
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Application No.: US15543101Application Date: 2015-01-30
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Publication No.: US10372584B2Publication Date: 2019-08-06
- Inventor: Masataka Nishi
- Applicant: Hitachi, Ltd.
- Applicant Address: JP Tokyo
- Assignee: HITACHI, LTD.
- Current Assignee: HITACHI, LTD.
- Current Assignee Address: JP Tokyo
- Agency: Foley & Lardner LLP
- International Application: PCT/JP2015/052608 WO 20150130
- International Announcement: WO2016/121074 WO 20160804
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/36

Abstract:
While the effectiveness of a model inspection method as a means for detecting software defects is known, large-scale software cannot be handled due to great amounts of calculation required for inspection. According to the present invention, after a model inspection problem of software is attributed to be a satisfiability determination problem, the problem is converted to a type that can be solved by a solver used for solving a notification optimization problem having constrained conditions, and the satisfiability is determined in a numerically analytical manner.
Public/Granted literature
- US20170364432A1 SOFTWARE INSPECTION APPARATUS Public/Granted day:2017-12-21
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