Invention Grant
- Patent Title: Conductive structure and method of forming the same
-
Application No.: US15897842Application Date: 2018-02-15
-
Publication No.: US10373907B2Publication Date: 2019-08-06
- Inventor: Pin-Wen Chen , Chih-Wei Chang
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Slater Matsil, LLP
- Main IPC: H01L21/768
- IPC: H01L21/768 ; H01L23/52 ; H01L23/48 ; H01L21/4763 ; H01L21/44 ; H01L23/532 ; H01L23/522 ; H01L23/528

Abstract:
Conductive structures and method of manufacture thereof are disclosed. A barrier layer can line the first recess of a substrate. A first seed layer can be formed on the barrier layer and line a bottom of the first recess and partially line sidewalls of the recess. A first conductive material can partially fill the first recess to form a second recess. The top surface of the first conductive material can coincide with a vertical extent of the first seed layer and have a depression formed therein. A second seed layer can be formed on the barrier layer and line the second recess. A second conductive material can fill the second recess.
Public/Granted literature
- US20180174963A1 Conductive Structure and Method of Forming the Same Public/Granted day:2018-06-21
Information query
IPC分类: