Invention Grant
- Patent Title: Selective surface modification of interconnect structures
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Application No.: US15724367Application Date: 2017-10-04
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Publication No.: US10373909B2Publication Date: 2019-08-06
- Inventor: Raghuveer R. Patlolla , Cornelius Brown Peethala , Roger A. Quon , Chih-Chao Yang
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee Address: US NY Armonk
- Agency: Cantor Colburn LLP
- Agent Vazken Alexanian
- Main IPC: H01L23/522
- IPC: H01L23/522 ; H01L23/532 ; H01L21/768

Abstract:
Semiconductor structures including copper interconnect structures and methods include selective surface modification of copper by providing a CuxTiyNz alloy in the surface. The methods generally include forming a titanium nitride layer on an exposed copper surface followed by annealing to form the CuxTiyNz, alloy in the exposed copper surface. Subsequently, the titanium layer is removed by a selective wet etching.
Public/Granted literature
- US20180082955A1 SELECTIVE SURFACE MODIFICATION OF INTERCONNECT STRUCTURES Public/Granted day:2018-03-22
Information query
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