Invention Grant
- Patent Title: Method of manufacturing semiconductor device through by-product removal from conductive layer
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Application No.: US15961143Application Date: 2018-04-24
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Publication No.: US10373973B2Publication Date: 2019-08-06
- Inventor: Won Joon Choi , Min Sung Ko , Kyeong Bae Kim , Jong Gi Kim , Dong Sun Sheen , Jung Myoung Shim , Young Ho Yang , Hyeng Woo Eom , Kwang Wook Lee , Woo Jae Chung
- Applicant: SK hynix Inc.
- Applicant Address: KR Gyeonggi-do
- Assignee: SK hynix Inc.
- Current Assignee: SK hynix Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T Group LLP
- Priority: KR10-2017-0116009 20170911
- Main IPC: H01L27/11582
- IPC: H01L27/11582 ; H01L21/28 ; H01L21/3213

Abstract:
The method of manufacturing a semiconductor device include: forming conductive patterns in interlayer spaces between interlayer insulating layers, the conductive patterns being separated from each other by a slit passing through the interlayer insulating layers, wherein the conductive patterns include a first by-product; generating a second by-product of a gas phase by reacting the first by-product remaining in the conductive patterns with source gas; and performing an out-gassing process to remove the second by-product.
Public/Granted literature
- US20190081066A1 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE Public/Granted day:2019-03-14
Information query
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