A system and method for testing of electrical connections, conductors, and loads prior to energizing those connections is disclosed. For example, an interlocking socket can comprise a receptacle designed to be coupled to a connector of a load. The interlocking socket can comprise a microprocessor coupled to the receptacle, the microcontroller operable for testing one or more faults in the connector, a conductor, or the load coupled to the connector. In another example, a microprocessor can be coupled to a switch comprising a conductor, where the microprocessor is operable for testing one or more faults in the conductor or a load coupled to the conductor.