- Patent Title: System and method for a deep learning machine for object detection
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Application No.: US15478947Application Date: 2017-04-04
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Publication No.: US10380741B2Publication Date: 2019-08-13
- Inventor: Arvind Yedla , Marcel Nassar , Mostafa El-Khamy , Jungwon Lee
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd
- Current Assignee: Samsung Electronics Co., Ltd
- Current Assignee Address: KR
- Agency: The Farrell Law Firm, P.C.
- Main IPC: G06T7/11
- IPC: G06T7/11 ; G06T7/194 ; G06N3/04 ; G06K9/00 ; G06K9/32 ; G06K9/46 ; G06K9/62

Abstract:
Apparatuses and methods of manufacturing same, systems, and methods for object detection using a region-based deep learning model are described. In one aspect, a method is provided, in which a region proposal network (RPN) is used to identify regions of interest (RoI) in an image by assigning a confidence levels, the assigned confidence levels of the RoIs are used to boost the background score assigned by the downstream classifier to each RoI, and the background scores are used in a softmax function to calculate the final class probabilities for each object class.
Public/Granted literature
- US20180158189A1 SYSTEM AND METHOD FOR A DEEP LEARNING MACHINE FOR OBJECT DETECTION Public/Granted day:2018-06-07
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