Invention Grant
- Patent Title: Multiple waveguide structure with single flange for automatic test equipment for semiconductor testing
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Application No.: US15016133Application Date: 2016-02-04
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Publication No.: US10381707B2Publication Date: 2019-08-13
- Inventor: Don Lee , Daniel Lam , Roger Mcaleenan , Kosuke Miyao
- Applicant: Advantest Corporation
- Applicant Address: JP Tokyo
- Assignee: ADVANTEST CORPORATION
- Current Assignee: ADVANTEST CORPORATION
- Current Assignee Address: JP Tokyo
- Main IPC: G01R1/24
- IPC: G01R1/24 ; G01R31/28 ; H01P5/18 ; H01P3/16 ; H01P3/12 ; H01P3/08 ; H01Q21/06 ; H01Q9/04 ; G01R1/04 ; H01P11/00 ; H01P5/02

Abstract:
Embodiments of the present disclosure use customizable waveguides that can be positioned next to each other in a structure that contains one single flange to provide a physical connection for the waveguides. In this fashion, many waveguides can be positioned within a small area to accommodate a tightly packed patch antenna array so that the waveguides can be positioned very close to the socket. As such, embodiments of the present disclosure allow more waveguides to be packed into a small area by providing a single structure that houses many waveguides and share only a single flange connection element that can be sized appropriately.
Public/Granted literature
- US20170229753A1 MULTIPLE WAVEGUIDE STRUCTURE WITH SINGLE FLANGE FOR AUTOMATIC TEST EQUIPMENT FOR SEMICONDUCTOR TESTING Public/Granted day:2017-08-10
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