Invention Grant
- Patent Title: Device and method for measuring workpieces
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Application No.: US15102033Application Date: 2014-12-05
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Publication No.: US10393505B2Publication Date: 2019-08-27
- Inventor: Ralf Christoph , Ingomar Schmidt , Benjamin Hopp , Sebastian Zoeller , Markus Hechler , Stefan Gruenwald , Andreas Ettemeyer , Sabine Linz-Dittrich , Matthias Andraes
- Applicant: WERTH MESSTECHNIK GMBH
- Applicant Address: DE Giessen
- Assignee: WERTH MESSTECHNIK GMBH
- Current Assignee: WERTH MESSTECHNIK GMBH
- Current Assignee Address: DE Giessen
- Agency: Ladas & Parry LLP
- Agent Malcolm J. MacDonald
- Priority: DE102013113651 20131206; DE102014101193 20140131; DE102014101537 20140207; DE102014104621 20140402; DE102014106022 20140429; DE102014111086 20140805; DE102014114027 20140926; DE102014115838 20141030
- International Application: PCT/EP2014/076713 WO 20141205
- International Announcement: WO2015/082683 WO 20150611
- Main IPC: G01B11/00
- IPC: G01B11/00 ; G01B5/012 ; G01B11/03

Abstract:
The invention relates to a device and a method for tactile/optical measuring of geometric features and structures on a workpiece. In order to be able to precisely align the probe extension for performing precise measurements without problems, a probe is proposed comprising a probe extension (13) having a flexurally elastic design at least in segments and having a mounting segment for mounting in a receptacle (14) comprising a mounting segment (60) implemented as a rotational lock.
Public/Granted literature
- US20160370172A1 DEVICE AND METHOD FOR MEASURING WORKPIECES Public/Granted day:2016-12-22
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