Invention Grant
- Patent Title: Three-dimensional scanner and measurement assistance processing method for same
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Application No.: US16070025Application Date: 2016-01-20
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Publication No.: US10393515B2Publication Date: 2019-08-27
- Inventor: Ryosuke Kawanishi , Makito Seki , Keisuke Sambongi , Yu Enomoto
- Applicant: MITSUBISHI ELECTRIC CORPORATION
- Applicant Address: JP Chiyoda-ku
- Assignee: MITSUBISHI ELECTRIC CORPORATION
- Current Assignee: MITSUBISHI ELECTRIC CORPORATION
- Current Assignee Address: JP Chiyoda-ku
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- International Application: PCT/JP2016/051598 WO 20160120
- International Announcement: WO2017/126060 WO 20170727
- Main IPC: G01B11/25
- IPC: G01B11/25 ; G01C3/06 ; G01C15/00 ; G01S17/89 ; G01S7/48 ; G01S17/58

Abstract:
In a three-dimensional scanner, a scanner main body calculates the position and direction of a depth sensor. The scanner main body also determines a movement candidate, which is a candidate for a position and direction to/in which the depth sensor is to be moved next. Then, the scanner main body acquires a feature within the movement candidate, which is the feature observable by the depth sensor from the movement candidate, and evaluates the stability of mapping performed from the movement candidate through use of the feature within the movement candidate. The scanner main body further presents at least any one of the moving direction or moving speed of the depth sensor to a user based on an evaluation result.
Public/Granted literature
- US20190049240A1 THREE-DIMENSIONAL SCANNER AND MEASUREMENT ASSISTANCE PROCESSING METHOD FOR SAME Public/Granted day:2019-02-14
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