Invention Grant
- Patent Title: Spectral detector and spectral detecting method using the same
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Application No.: US15799220Application Date: 2017-10-31
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Publication No.: US10393585B2Publication Date: 2019-08-27
- Inventor: Sookyoung Roh , Sunghyun Nam
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2016-0144481 20161101
- Main IPC: G01J3/42
- IPC: G01J3/42 ; G01J3/18 ; G01J3/28 ; G01J3/02

Abstract:
A spectral detector includes a grating panel including a first grating pattern having a first period, a second grating pattern having a second period that is different from the first period, and a light exit surface through light exits the grating panel, and an optical measurement panel arranged to face the light exit surface of the grating panel, and configured to measure a change in intensity of first light passing through the first grating pattern according to a propagation distance of the first light, and to measure a change in intensity of second light passing through the second grating pattern according to a propagation distance of the second light.
Public/Granted literature
- US20180052048A1 SPECTRAL DETECTOR AND SPECTRAL DETECTING METHOD USING THE SAME Public/Granted day:2018-02-22
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