Invention Grant
- Patent Title: Method for testing connectivity
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Application No.: US15866440Application Date: 2018-01-09
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Publication No.: US10393790B2Publication Date: 2019-08-27
- Inventor: Hsueh-Chih Lu , Lien-Feng Chen
- Applicant: Inventec (Pudong) Technology Corporation , INVENTEC CORPORATION
- Applicant Address: CN Shanghai TW Taipei
- Assignee: Inventec (Pudong) Technology Corporation,INVENTEC CORPORATION
- Current Assignee: Inventec (Pudong) Technology Corporation,INVENTEC CORPORATION
- Current Assignee Address: CN Shanghai TW Taipei
- Agency: CKC & Partners Co., LLC
- Priority: CN201711164999 20171121
- Main IPC: G01R31/02
- IPC: G01R31/02

Abstract:
The present disclosure relates to a method for testing connectivity. The method is applied to an electronic equipment which is disposed include two test units (e.g. network interface controller, RJ-45 connector) and a network transformer. The test unit couple to the network transformer so that can send a high frequency test signal or a low frequency test signal to the network transformer respectively. When the test unit receives a low frequency response signal, it means correspond internal circuitry of the network transformer does not have a open circuit fault. When the test unit does not receive a high frequency response signal, it means correspond pins of the network transformer does not have a short circuit fault.
Public/Granted literature
- US20190154745A1 METHOD FOR TESTING CONNECTIVITY Public/Granted day:2019-05-23
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