Invention Grant
- Patent Title: Numerical control system for detecting defects
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Application No.: US15277310Application Date: 2016-09-27
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Publication No.: US10394196B2Publication Date: 2019-08-27
- Inventor: Hiroshige Ando
- Applicant: FANUC CORPORATION
- Applicant Address: JP Yamanashi
- Assignee: Fanuc Corporation
- Current Assignee: Fanuc Corporation
- Current Assignee Address: JP Yamanashi
- Agency: RatnerPrestia
- Priority: JP2015-189541 20150928
- Main IPC: G05B13/04
- IPC: G05B13/04 ; G05B19/4063 ; G06F17/50 ; G05B23/02

Abstract:
A numerical control system includes a computer aided design (CAD) data storage means for storing CAD data, an input/output (I/O) assignment data storage means for storing I/O assignment data, and a relevant information storage means for recording relevant information between the I/O assignment data and mounting information included in CAD data of each of the I/O units, and displays a defect occurrence region on a shape image of a control panel.
Public/Granted literature
- US20170090436A1 NUMERICAL CONTROL SYSTEM Public/Granted day:2017-03-30
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