Invention Grant
- Patent Title: Retaining ring for lower wafer defects
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Application No.: US15074089Application Date: 2016-03-18
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Publication No.: US10399202B2Publication Date: 2019-09-03
- Inventor: Yongqi Hu , Simon Yavelberg , Gangadhar Sheelavant , Kadthala R. Narendrnath
- Applicant: Applied Materials, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Patterson + Sheridan, LLP
- Main IPC: B24B37/32
- IPC: B24B37/32

Abstract:
A retaining ring and a chemical mechanical planarization system (CMP) are disclosed. In one embodiment, a retaining ring for a polishing system includes a ring-shaped body having a polished inner diameter. The body has a bottom surface having grooves formed therein, an outer diameter wall, and an inner diameter wall, wherein the inner diameter wall is polished to a roughness average (Ra) of less than about 30 microinches (μin).
Public/Granted literature
- US20160271750A1 RETAINING RING FOR LOWER WAFER DEFECTS Public/Granted day:2016-09-22
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