Invention Grant
- Patent Title: Life cycle pallet tester and associated methods
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Application No.: US15656163Application Date: 2017-07-21
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Publication No.: US10401269B2Publication Date: 2019-09-03
- Inventor: Dwight Bryan Whitfield, Sr. , Paul Barnswell , James Koonce , Matthew Wood , Mohammad Ansari
- Applicant: CHEP Technology Pty Limited
- Applicant Address: AU Sydney
- Assignee: CHEP Technology Pty Limited
- Current Assignee: CHEP Technology Pty Limited
- Current Assignee Address: AU Sydney
- Agency: Allen, Dyer, Doppelt + Gilchrist. PA
- Main IPC: G01N3/30
- IPC: G01N3/30 ; B65G13/00 ; B65G43/08 ; B65G47/82 ; G01M7/08 ; B65D19/38

Abstract:
A pallet tester includes a pallet positioning station for positioning a pallet on a conveyor, and a pallet impact station adjacent the conveyor and aligned with the pallet positioning station. The pallet positioning station includes a pallet push arm movable between a retracted position and a pallet positioning position. The pallet impact station includes a carriage assembly to impact the pallet, and a latching mechanism coupled to the carriage assembly. A controller moves the pallet push arm to the retracted position to receive the pallet for positioning, and moves the pallet push arm to the pallet positioning position to move the pallet towards the pallet impact station until an impact side of the pallet is aligned with an impact reference plane. The controller also operates the latching mechanism to raise the carriage assembly, and to release the carriage assembly when a height of the carriage assembly corresponds to a desired release height so that a predetermined impact force strikes the pallet at the impact reference plane.
Public/Granted literature
- US20190025170A1 LIFE CYCLE PALLET TESTER AND ASSOCIATED METHODS Public/Granted day:2019-01-24
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